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Анализ отказов батарей с использованием синхротронного основе жесткого рентгеновского микротомография
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August 26, 2015
DOI:
1Department of Materials Science and Engineering,University of California Berkeley, 2Materials Science Division,Lawrence Berkeley National Laboratory, 3Advanced Light Source Division,Lawrence Berkeley National Laboratory, 4Department of Chemical and Biomolecular Engineering,University of California Berkeley, 5Environmental Energy Technology Division,Lawrence Berkeley National Laboratory
Summary
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Synchrotron-based hard X-ray microtomography is used to image the electrochemical growth of dendrites from a lithium metal electrode through a solid polymer electrolyte membrane.
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Harry, K. J., Parkinson, D. Y., Balsara, N. P. Failure Analysis of Batteries Using Synchrotron-based Hard X-ray Microtomography. J. Vis. Exp. (102), e53021, doi:10.3791/53021 (2015).
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