In order to observe ultrastructure of insect sensilla, scanning and transmission electron microscopy (SEM and TEM, respectively) sample preparation protocol were presented in the study. Tween 20 was added into the fixative to avoid sample deformation in SEM. Fluorescence microscopy was helpful for improving slicing accuracy in TEM.
Zhang, Y., Qiao, H., Ren, L., Wang, R., Lu, P. Sample Preparation Method of Scanning and Transmission Electron Microscope for the Appendages of Woodboring Beetle. J. Vis. Exp. (156), e59251, doi:10.3791/59251 (2020).