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Writing and Low-Temperature Characterization of Oxide Nanostructures
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July 18, 2014
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Oxide nanostructures provide new opportunities for science and technology. The interfacial conductivity between LaAlO3 and SrTiO3 can be controlled with near-atomic precision using a conductive atomic force microscopy technique. The protocol for creating and measuring conductive nanostructures at LaAlO3/SrTiO3 interfaces is demonstrated.
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Levy, A., Bi, F., Huang, M., Lu, S., Tomczyk, M., Cheng, G., Irvin, P., Levy, J. Writing and Low-Temperature Characterization of Oxide Nanostructures. J. Vis. Exp. (89), e51886, doi:10.3791/51886 (2014).
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