1Mechatronics Research Lab, Department of Mechanical Engineering,Massachusetts Institute of Technology, 2Mechatronics Group, Department of Mechanical Engineering,Ilmenau University of Technology, 3Production and Precision Measurement Technology Group, Institute of Process Measurement and Sensor Technology,Ilmenau University of Technology, 4Nanoscale Systems Group, Institute of Process Measurement and Sensor Technology,Ilmenau University of Technology, 5nano analytik GmbH
Yazar
Kurum
1Mechatronics Research Lab, Department of Mechanical Engineering,Massachusetts Institute of Technology, 2Mechatronics Group, Department of Mechanical Engineering,Ilmenau University of Technology, 3Production and Precision Measurement Technology Group, Institute of Process Measurement and Sensor Technology,Ilmenau University of Technology, 4Nanoscale Systems Group, Institute of Process Measurement and Sensor Technology,Ilmenau University of Technology, 5nano analytik GmbH
AUTHORS
1Mechatronics Research Lab, Department of Mechanical Engineering,Massachusetts Institute of Technology, 2Mechatronics Group, Department of Mechanical Engineering,Ilmenau University of Technology, 3Production and Precision Measurement Technology Group, Institute of Process Measurement and Sensor Technology,Ilmenau University of Technology, 4Nanoscale Systems Group, Institute of Process Measurement and Sensor Technology,Ilmenau University of Technology, 5nano analytik GmbH
Yazar
Kurum
1Mechatronics Research Lab, Department of Mechanical Engineering,Massachusetts Institute of Technology, 2Mechatronics Group, Department of Mechanical Engineering,Ilmenau University of Technology, 3Production and Precision Measurement Technology Group, Institute of Process Measurement and Sensor Technology,Ilmenau University of Technology, 4Nanoscale Systems Group, Institute of Process Measurement and Sensor Technology,Ilmenau University of Technology, 5nano analytik GmbH
AUTHORS
Yazar
Kurum
AUTHORS
