Valutare plasmoniche Trasporti in Current-carrying Argento Nanowires
Summary
Silver nanowires can simultaneously transport electrons and optical information in the form of surface plasmons. A procedure is described here to realize such a shared circuitry and the limitations at propagating both information carriers are evaluated.
Abstract
Plasmonics is an emerging technology capable of simultaneously transporting a plasmonic signal and an electronic signal on the same information support1,2,3. In this context, metal nanowires are especially desirable for realizing dense routing networks4. A prerequisite to operate such shared nanowire-based platform relies on our ability to electrically contact individual metal nanowires and efficiently excite surface plasmon polaritons5 in this information support. In this article, we describe a protocol to bring electrical terminals to chemically-synthesized silver nanowires6 randomly distributed on a glass substrate7. The positions of the nanowire ends with respect to predefined landmarks are precisely located using standard optical transmission microscopy before encapsulation in an electron-sensitive resist. Trenches representing the electrode layout are subsequently designed by electron-beam lithography. Metal electrodes are then fabricated by thermally evaporating a Cr/Au layer followed by a chemical lift-off. The contacted silver nanowires are finally transferred to a leakage radiation microscope for surface plasmon excitation and characterization8,9. Surface plasmons are launched in the nanowires by focusing a near infrared laser beam on a diffraction-limited spot overlapping one nanowire extremity5,9. For sufficiently large nanowires, the surface plasmon mode leaks into the glass substrate9,10. This leakage radiation is readily detected, imaged, and analyzed in the different conjugate planes in leakage radiation microscopy9,11. The electrical terminals do not affect the plasmon propagation. However, a current-induced morphological deterioration of the nanowire drastically degrades the flow of surface plasmons. The combination of surface plasmon leakage radiation microscopy with a simultaneous analysis of the nanowire electrical transport characteristics reveals the intrinsic limitations of such plasmonic circuitry.
Introduction
Plasmonics aims at merging electronics and photonics in a shared physical support via the mediation of an electron density wave called a surface plasmon polariton1,2,3. Surface plasmon can travel in various waveguide geometries and interfaces. Among them, metal nanowires are especially desirable. As quasi-one dimensional structures they drastically confine the plasmon field to deep subwavelength scale while acting as electrical interconnects capable of sustaining an electron flow as depicted by the artistic drawing of Figure 1.
Both surface plasmon propagation and electron transport are sensitive to structural inhomogeneities of the nanowire (e.g. kinks, crystalline defects, etc.). Because they can grow as a single crystal with few defects, chemically-synthesized metal nanowires6 typically provide improved transport performances over amorphous metal nanowires fabricated by top-down approaches (e.g. electron beam lithography)12. The realization of a plasmonic network unit cell requires transferring the nanowires from a colloidal solution to a glass substrate. Without any specific complex prepatterning like surface functionalization13 or self-assembly techniques14, nanowires are generally randomly oriented on the substrate. This uncontrolled distribution of orientations drastically complicates the electrical connection of the nanowire to an outside power source.
In this article, randomly oriented chemically-synthesized silver nanowires are successfully contacted by source and drain electrical terminals. To this purpose optical microscopy is combined with electron-beam lithography to precisely locate the nanowire and create electrical contacts15,16. A characterization procedure evaluating the electro-plasmonic performances of the circuitry is described. After electrode fabrication, the contacted nanowires are transferred to a surface plasmon leakage radiation microscope for analyzing the effect of an electron flow on the propagation of surface plasmons. The microscope uses an inverted base equipped with a high numerical aperture oil-immersion objective and two charge-coupled device (CCD) cameras placed at the conjugate object plane and conjugate Fourier plane, respectively. These two conjugate planes provide complementary information on surface plasmon properties. Details of the propagation are directly inferred from image plane analysis, while the momentum distribution is visualized by Fourier plane imaging9.
Surface plasmons are excited in an individual nanowire by focusing a near-infrared laser beam in a diffraction-limited spot at the glass/air interface. When a nanowire extremity is aligned inside the focal region, the scattered incident laser light creates a broad distribution of wave-vectors, some of them resonant with the excitation of a surface plasmon. The propagation of this surface wave is visualized either by collecting the leakage of the mode emitted in the substrate or by observing the plasmon scattered at the nanowire distal end. The propagation length and effective index of the leaky surface plasmon mode are measured by analyzing the intensity distributions in a dual-plane leakage radiation microscopy.
Once a surface plasmon develops in the nanowire, the drain and source terminals at each extremity of the nanowire are connected to a regulated voltage supply. The CCD cameras monitor in real time the surface plasmon properties as a function of current flowing through the nanowire. For each value of the electrical transfer characteristic, the effective index and the propagation length of the surface plasmon mode are determined. This procedure enables to estimate the limitation of a nanowire-based circuitry to simultaneously sustain the transport of electrons and plasmons7.
Protocol
Representative Results
Discussion
The synthesis uses an excess of chemical surfactant remaining bound to the surface of the nanowire as illustrated in the transmission electron micrograph of Figure 9(a). This layer creates a dielectric barrier preventing the current to flow through the electrode-nanowire interface. Figures 10(a) and (b) show typical examples of the current-voltage characteristics. Sharp current steps at certain biases punctuate the curves. These steps occur when the current den…
Disclosures
The authors have nothing to disclose.
Acknowledgements
The research leading to these results has received funding from the European Research Council under the European Community’s Seventh Framework Program FP7/2007–2013 Grant Agreement no 306772 and Grant ERC-2007-StG No. 203872-COMOSYEL. This work is also partially funded by the Agence Nationale de la Recherche (ANR) under Grant Plastips (ANR-09-BLAN-0049). A. S. thanks a postdoctoral scholarship from the Région de Bourgogne under the PARI program. M.S. acknowledges a stipend from the Chinese Scholarship Council. D.Z. acknowledges support from the National Natural Science Foundation of China for Grants 11004182 and 61036005.
Materials
| DMEM | Invitrogen | ABCD1234 |
| Ethylene glycol (EG) | Sinopharm Chemical Reagent Co., Ltd | T20111130 |
| PMMA | Allresist | AR-P 679 |
| Acetone Analar Normapur | VWR Prolabo | 20066.296 |
| Isopropanol (IPA) Analar Normapur | VWR Prolabo | 20842.298 |
| AgNO3 | Sinopharm Chemical Reagent Co., Ltd | 20080826 |
| Poly-(vinylpyrrolidone) (PVP) | Aladdin Chemistry Co., Ltd | 1041671-31744 |
| Dimethysilicone | Sinopharm Group Company Limited | H201-500 |
| Propylene Glycol Methyl Ether Acetate | Microchemicals Gmbh | AZ EBR |
| Inverted optical microscope | Nikon | TE 2000 |
| Microscope objective | Nikon | 1.49/100X TIRF Plan-Apo |
| CCD Cameras (2x) | Andor | Luca-S |
| Regulated power supply | RHK | SPM 1000 |
| Acquisition data | RHK | SPM 1000 |
| Current to voltage converter | homemade | Gain 10 mA/V |
| Electron beam microscope | JEOL | FEG 6500 |
| Lithography addon | RAITH | Elphy |
| Spincoater | PRIMUS | STT15 |
| Thermal evaporator | PLASSYS | MEB 400 |
| Micrometer probing stage (2x) | SÜSS MicroTec | PH110 |
| Piezoelectric stage | Mad City Labs | Nano LP100 |
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