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开尔文探针力显微镜与其他显微镜和光谱学共定位：合金腐蚀表征中的选定应用
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JoVE Journal Engenharia
Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys
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开尔文探针力显微镜与其他显微镜和光谱学共定位：合金腐蚀表征中的选定应用

DOI:
10.3791/64102-v

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12:18 min

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June 27, 2022

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, , , , ,
1Micron School of Materials Science & Engineering,Boise State University, 2Material, Physical, and Chemical Sciences Center,Sandia National Laboratories, 3Center for Advanced Energy Studies

Capítulos

  • 00:05Introduction
  • 01:08Sample Preparation for Co-Localized Imaging of a Metal Alloy
  • 02:11KPFM Imaging
  • 06:51SEM, EDS, and EBSD Imaging
  • 07:41KPFM, SEM, EDS, and EBSD Image Overlay and Analysis
  • 09:37Results I: 3D Printed Ternary Ti Alloy: KPFM and SEM/EBSD
  • 10:41Results II: Cross-Sectional Analysis of Zr Alloys for Nuclear Cladding: KPFM, SEM, and Raman
  • 11:21Conclusion

Summary

Tadução automática

Tadução automática

开尔文探针力显微镜（KPFM）测量表面形貌和表面电位差异，而扫描电子显微镜（SEM）和相关光谱可以阐明表面形态、组成、结晶度和晶体取向。因此，SEM与KPFM的共定位可以深入了解纳米级成分和表面结构对腐蚀的影响。

Tags

Keywords: Kelvin Probe Force Microscopy (KPFM)Scanning Electron Microscopy (SEM)ColocalizationCorrosion CharacterizationAlloysSurface PotentialSurface TopographyMaterial StructureProperty PerformanceSample PreparationConductive PathAFM Probe

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