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Elektron Mikroskopisi ile Pikometre-Hassas Atomik Konum Takibi

JoVE Journal
Química
Author Produced

This content is Free Access.

JoVE Journal Química

Picometer-Precision Atomic Position Tracking through Electron Microscopy

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Elektron Mikroskopisi ile Pikometre-Hassas Atomik Konum Takibi

5,623 Views

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15:04 min

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July 03, 2021

DOI:

10.3791/62164-v

DOI:

10.3791/62164-v

•

15:04 min

July 03, 2021

•

12 Views

Leixin Miao, Adrian Chmielewski, Debangshu Mukherjee, Nasim Alem

¹Department of Materials Science & Engineering,The Pennsylvania State University, ²Center for Nanophase Materials Sciences,Oak Ridge National Laboratory

Tags

Atomic Position Tracking Electron Microscopy Aberration Correction STEM Imaging Atomic Resolution Lattice Strain Defects Image Denoising Drift Correction Atom Column Quantification Overlapping Atoms MATLAB Application EasySTEM

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