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Análisis Cuantitativo Del Sitio Atómico De Los Dopantes Funcionales / Defectos Puntuales En Materiales Cristalinos Por Microanálisis Mejorado Por Canalización De Electrones-Mejorado
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Química
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JoVE Journal Química
Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Análisis Cuantitativo Del Sitio Atómico De Los Dopantes Funcionales / Defectos Puntuales En Materiales Cristalinos Por Microanálisis Mejorado Por Canalización De Electrones-Mejorado

4,934 Views

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07:24 min

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May 10, 2021

DOI:

10.3791/62015-v

DOI:
10.3791/62015-v

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07:24 min
May 10, 2021

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11 Views
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1Electron Nanoscopy Division, Advanced Measurement Technology Center, Institute of Materials & Systems for Sustainability,Nagoya University

Tags

Quantitative AnalysisAtomic-siteFunctional DopantsPoint DefectsCrystalline MaterialsElectron-channeling-enhanced MicroanalysisEnergy-dispersive X-ray SpectroscopyElectron Energy-loss SpectroscopyLattice DefectsVacanciesInterstitialsGrain BoundariesTransmission Electron MicroscopySTEMOptical Axis AlignmentBeam RockingCaustic SpotCondenser Aperture

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Ohtsuka, M., Muto, S. Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis. J. Vis. Exp. (171), e62015, doi:10.3791/62015 (2021).

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