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Kwantitatieve atomaire-site analyse van functionele dopants/puntdefecten in kristallijne materialen door elektronengeankan-verbeterde microanalyse

JoVE Journal
Química

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JoVE Journal Química

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

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Kwantitatieve atomaire-site analyse van functionele dopants/puntdefecten in kristallijne materialen door elektronengeankan-verbeterde microanalyse

4,934 Views

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07:24 min

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May 10, 2021

DOI:

10.3791/62015-v

DOI:

10.3791/62015-v

•

07:24 min

May 10, 2021

•

11 Views

Masahiro Ohtsuka, Shunsuke Muto

¹Electron Nanoscopy Division, Advanced Measurement Technology Center, Institute of Materials & Systems for Sustainability,Nagoya University

Tags

Quantitative Analysis Atomic-site Functional Dopants Point Defects Crystalline Materials Electron-channeling-enhanced Microanalysis Energy-dispersive X-ray Spectroscopy Electron Energy-loss Spectroscopy Lattice Defects Vacancies Interstitials Grain Boundaries Transmission Electron Microscopy STEM Optical Axis Alignment Beam Rocking Caustic Spot Condenser Aperture

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