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用于ToF-SIMS和XPS分析的纳米颗粒的制备
JoVE Journal
Química
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JoVE Journal Química
Preparation of Nanoparticles for ToF-SIMS and XPS Analysis
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用于ToF-SIMS和XPS分析的纳米颗粒的制备

DOI:
10.3791/61758-v

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06:24 min

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September 13, 2020

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, , , , , , ,
1Division of Surface Analysis and Interfacial Chemistry,Federal Institute for Material Research and Testing (BAM), 2Department of Chemical and Product Safety,German Federal Institute for Risk Assessment (BfR)

Capítulos

  • 00:05Introduction
  • 00:45Nanoparticle Suspension Preparation, Drop-Dry Deposition, and Spin Coating Deposition
  • 02:24Nanoparticle Powder Deposition
  • 03:15Nanoparticle Suspension Cryofixation
  • 04:06Results: Representative Nanoparticle Preparation for Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and X-Ray Photoelectron Spectroscopy (XPS) Analysis
  • 05:41Conclusion

Summary

Tadução automática

Tadução automática

介绍了制备用于表面分析的纳米颗粒的多种不同程序（滴铸，旋涂，粉末沉积和冷冻固定）。我们讨论了每种方法的挑战，机遇和可能的应用，特别是关于不同制备方法引起的表面性能变化。

Tags

NanoparticlesSurface AnalysisToF-SIMSXPSSample PreparationSuspensionDrop Dry MethodSpin CoatingPowder DepositionUV Ozone CleanerVacuumSilicon WaferO-ringMicroscopySEM

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