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Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
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Engenharia
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JoVE Journal Engenharia
Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station

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05:57 min

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April 01, 2020

DOI:

10.3791/60269-v

DOI:
10.3791/60269-v

•

05:57 min
April 01, 2020

•

2 Views
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1University Grenoble Alpes and CEA, LETI, Minatec Campus

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Tyler, N. A., Guerber, S., Fowler, D., Malhouitre, S., Garcia, S., Grosse, P., Szelag, B. Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station. J. Vis. Exp. (158), e60269, doi:10.3791/60269 (2020).

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