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09:09 min
August 10, 2019
DOI:
10.3791/59480-v
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Guérin, C. J., Kremer, A., Borghgraef, P., Lippens, S. Targeted Studies Using Serial Block Face and Focused Ion Beam Scan Electron Microscopy. J. Vis. Exp. (150), e59480, doi:10.3791/59480 (2019).
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