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Targeted Studies Using Serial Block Face and Focused Ion Beam Scan Electron Microscopy
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Biology
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Targeted Studies Using Serial Block Face and Focused Ion Beam Scan Electron Microscopy

Targeted Studies Using Serial Block Face and Focused Ion Beam Scan Electron Microscopy

English

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8,883 Views

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09:09 min

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August 10, 2019

DOI:

10.3791/59480-v

DOI:
10.3791/59480-v

•

09:09 min
August 10, 2019

•

1 Views
, , ,
1VIB Bio Imaging Core, 2VIB Inflammation Research Center, 3Department of Molecular Biomedical Research,UGent

Summary

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Here, we present a protocol for efficiently combining serial block face and focused ion beam scanning electron microscopy to target an area of interest. This allows for efficient searching, in three dimensions, and locating rare events in a large field of view.

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Cite this Article

Guérin, C. J., Kremer, A., Borghgraef, P., Lippens, S. Targeted Studies Using Serial Block Face and Focused Ion Beam Scan Electron Microscopy. J. Vis. Exp. (150), e59480, doi:10.3791/59480 (2019).

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