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06:06 min
February 06, 2018
DOI:
10.3791/57199-v
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Scarff, C. A., Fuller, M. J. G., Thompson, R. F., Iadanza, M. G. Variations on Negative Stain Electron Microscopy Methods: Tools for Tackling Challenging Systems. J. Vis. Exp. (132), e57199, doi:10.3791/57199 (2018).
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