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Sub-Nanometer Auflösung Belichtung mit Amplituden-Modulation der Rasterkraftmikroskopie in Liquid
JoVE Journal
Engenharia
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JoVE Journal Engenharia
Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
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Sub-Nanometer Auflösung Belichtung mit Amplituden-Modulation der Rasterkraftmikroskopie in Liquid

15,988 Views

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10:25 min

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December 20, 2016

DOI:

10.3791/54924-v

DOI:
10.3791/54924-v

•

10:25 min
December 20, 2016

•

6 Views
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1Physics Department,Durham University

Tags

Sub-nanometer ResolutionAmplitude-modulation Atomic Force MicroscopyLiquidHigh Resolution ImagingCommercial AFMTapping ModeSample PreparationCleaningMica SubstrateEpoxy GlueAdhesive Tape

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Cite this Article

Miller, E. J., Trewby, W., Farokh Payam, A., Piantanida, L., Cafolla, C., Voïtchovsky, K. Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid. J. Vis. Exp. (118), e54924, doi:10.3791/54924 (2016).

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