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通过与核反应分析深度剖面的表面和界面层和颗粒材料氢含量的定量
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Quantification of Hydrogen Concentrations in Surface and Interface Layers and Bulk Materials through Depth Profiling with Nuclear Reaction Analysis
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通过与核反应分析深度剖面的表面和界面层和颗粒材料氢含量的定量

DOI:
10.3791/53452-v

•

14:11 min

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March 29, 2016

•

, , , ,
1Institute of Industrial Science,The University of Tokyo, 2Micro Analysis Laboratory, Tandem accelerator, The University Museum,The University of Tokyo

Capítulos

  • 00:05Título
  • 01:29Single Crystal Surface Preparation for Nuclear Reaction Analysis (NRA) in Ultra-high Vacuum
  • 08:07Surface Hydrogen Nuclear Reaction Analysis Measurements
  • 09:24Bulk and Interface Hydrogen Nuclear Reaction Analysis: Preparation and Measurement
  • 11:02Results: Nuclear Reaction Analysis Hydrogen Depth Profiles for Single Crystal Palladium and from Silicon Dioxide Films on Silicon
  • 12:50Conclusion

Summary

Tadução automática

Tadução automática

我们说明1 H的应用（15 N，αγ）12 C共振核反应分析（NRA）定量评价的表面上的氢原子的密度，在体积，并在固体材料的界面层。钯（110）单晶2 / Si的（100）堆叠的和SiO的近表面氢深度剖面进行说明。

Tags

Hydrogen ConcentrationNuclear Reaction AnalysisDepth ProfilingSurface And Interface LayersBulk MaterialsHydrogen StorageFuel CellsHydrogenation CatalystsSemiconductor TechnologyPalladiumLow Energy Electron DiffractionAuger Electron Spectroscopy

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