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Scanning-probe Single-electron Capacitance Spectroscopy
 

Scanning-probe Single-electron Capacitance Spectroscopy

Article DOI: 10.3791/50676-v • 10:53 min • July 30th, 2013
July 30th, 2013 •
1, 1, 1,2, 1,3, 4, 1
1Department of Physics and Astronomy, Michigan State University, 2Department of Chemistry & Biochemistry/Physics, Mercyhurst University, 3Department of Physics, Saint Louis University, 4Department of Physics, Massachusetts Institute of Technology

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Scanning-probe single-electron capacitance spectroscopy facilitates the study of single-electron motion in localized subsurface regions. A sensitive charge-detection circuit is incorporated into a cryogenic scanning probe microscope to investigate small systems of dopant atoms beneath the surface of semiconductor samples.

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Scanning-probe Single-electron Capacitance Spectroscopy Low-temperature Scanning-probe Techniques Electronic Quantum Structure Small Systems Atomic Dopants Semiconductors Subsurface Charge Accumulation (SCA) Imaging Capacitance-based Method Spatial Resolution Individual Atomic Dopants Electron Motion Insulating Surface Electric-field-sensitive Scanned-probe Techniques Radius Of Curvature Probe Tip Nanometers Charge Resolution Charge Detection Circuitry High Electron Mobility Transistors (HEMT) Cryogenic Temperatures
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