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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
JoVE Journal
工学
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JoVE Journal 工学
Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

DOI:

10:39 min

October 11, 2016

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  • 00:05標題
  • 00:41Preparation of the 2-D Checkerboard Phase Grating
  • 04:43Experiment Setup and Alignment at the Synchrotron Facility
  • 06:17Performing Coherence Measurements
  • 08:19Results: Representative Data Measured Using 18 keV X-rays at 1-BM-B Experiment Hutch of Advanced Photon Source
  • 09:59Conclusion

概要

自動翻訳

The measurement protocol and data analysis procedure are given for obtaining transverse coherence of a synchrotron radiation X-ray source along four directions simultaneously using a single 2-D checkerboard phase grating. This simple technique can be applied for complete transverse coherence characterization of X-ray sources and X-ray optics.

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