Rivista
/
Ingegneria
/
In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx
JoVE Journal
Ingegneria
È necessario avere un abbonamento a JoVE per visualizzare questo.  Accedi o inizia la tua prova gratuita.
JoVE Journal Ingegneria
In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx

In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx

3,848 Views

•

09:49 min

•

May 13, 2020

DOI:

10.3791/61026-v

DOI:
10.3791/61026-v

•

09:49 min
May 13, 2020

•

9 Views
, ,
1Functional Materials and Microsystems Research Group and the Micro Nano Research Facility,RMIT University, 2RMIT Microscopy and Microanalysis Facility,RMIT University

Explore More Videos

In-situ Transmission Electron MicroscopyBiasingCrossbar DevicesAmorphous Vanadium OxideNano-structural ChangesMetal-insulator-metal DevicePhotolithographyPhysical Vapor DepositionLift-offBiasing ChipGridbar

Read Article

Cite this Article

Nirantar, S., Mayes, E., Sriram, S. In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx. J. Vis. Exp. (159), e61026, doi:10.3791/61026 (2020).

Download .ris file

Copy

Share Video

.

Copy