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Quantifying X-Ray Fluorescence Data Using MAPS
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JoVE Journal Chimica
Quantifying X-Ray Fluorescence Data Using MAPS

Quantifying X-Ray Fluorescence Data Using MAPS

DOI:
10.3791/56042-v

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14:58 min

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February 17, 2018

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, , , , ,
1School for Engineering of Matter, Transport, and Energy,Arizona State University, 2School of Electrical, Computer, and Energy Engineering,Arizona State University, 3Advanced Photon Source,Argonne National Laboratory

Capitoli

  • 00:00Titolo
  • 03:13Run the Fitting
  • 10:03Run the Fitting
  • 12:05Risultati
  • 14:02Conclusion

Summary

Traduzione automatica

Traduzione automatica

Here, we demonstrate the use of the X-ray fluorescence fitting software, MAPS, created by Argonne National Laboratory for the quantification of fluorescence microscopy data. The quantified data that results is useful for understanding the elemental distribution and stoichiometric ratios within a sample of interest.

Tags

X-ray FluorescenceQuantificationMAPSSynchrotronElemental SegregationStoichiometryClusteringAerial MassesIDL SoftwareArgonne National LaboratoryFittingMaps Fit Parameters Override.txtMaps Settings.txtMdaAXO StandardNIST Standard

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