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15:04 min
July 03, 2021
DOI:
10.3791/62164-v
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Miao, L., Chmielewski, A., Mukherjee, D., Alem, N. Picometer-Precision Atomic Position Tracking through Electron Microscopy. J. Vis. Exp. (173), e62164, doi:10.3791/62164 (2021).
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