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Chapitres
- 00:04Introduction
- 01:17Sample Preparation for AFM-SECM
- 02:01Setup and Operation of AFM-SECM
- 06:24Results: Topography and Current Imaging of ONBs and Cu2O NPs by AFM-SECM
- 07:33Conclusion
Atomic force microscopy (AFM) combined with scanning electrochemical microscopy (SECM), namely, AFM-SECM, can be used to simultaneously acquire high-resolution topographical and electrochemical information on material surfaces at nanoscale. Such information is critical to understanding heterogeneous properties (e.g., reactivity, defects, and reaction sites) on local surfaces of nanomaterials, electrodes and biomaterials.
