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Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
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Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic

11,158 Views

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06:46 min

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August 25, 2016

DOI:

10.3791/54408-v

DOI:
10.3791/54408-v

•

06:46 min
August 25, 2016

•

5 Views
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1Department of Nuclear Science and Engineering,Massachusetts Institute of Technology, 2Department of Physics,Massachusetts Institute of Technology, 3Plasma Science and Fusion Center,Massachusetts Institute of Technology

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Cao, N. M., Mier Valdivia, A. M., Rice, J. E. Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic. J. Vis. Exp. (114), e54408, doi:10.3791/54408 (2016).

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