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Characterization of Nanocrystal Size Distribution using Raman Spectroscopy with a Multi-particle Phonon Confinement Model
 

Characterization of Nanocrystal Size Distribution using Raman Spectroscopy with a Multi-particle Phonon Confinement Model

Article DOI: 10.3791/53026-v • 06:54 min • August 22nd, 2015
August 22nd, 2015 •
1, 1,2
1Department of Applied Physics, Eindhoven University of Technology, 2Dutch Institute for Fundamental Energy Research

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résumé
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We demonstrate how to determine the size distribution of semiconductor nanocrystals in a quantitative manner using Raman spectroscopy employing an analytically defined multi-particle phonon confinement model. Results obtained are in excellent agreement with the other size analysis techniques like transmission electron microscopy and photoluminescence spectroscopy.

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Nanocrystal Size Distribution Raman Spectroscopy Multi-particle Phonon Confinement Model Analysis Semiconductor Nanocrystals Size-dependent Properties Transmission Electron Microscopy (TEM) X-ray Diffraction (XRD) Photoluminescence Spectroscopy (PL) Non-destructive Fast Reliable Volumetric Ratios Analytical Expression Generic Distribution Function Free-standing Silicon Nanocrystals (Si-NCs) Multi-modal Size Distributions TEM Results PL Results
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