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The Effect of Anodization Parameters on the Aluminum Oxide Dielectric Layer of Thin-Film Transistors
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The Effect of Anodization Parameters on the Aluminum Oxide Dielectric Layer of Thin-Film Transistors

The Effect of Anodization Parameters on the Aluminum Oxide Dielectric Layer of Thin-Film Transistors

DOI:
10.3791/60798-v

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12:32 min

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May 24, 2020

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, , , ,
1School of Technology and Sciences,São Paulo State University – UNESP, 2Scholl of Electronic Engineering,Bangor University, 3Institute of Geosciences and Exact Sciences,São Paulo State University – UNESP

Capítulos

  • 00:00Introduction
  • 02:48Preparation of the Electrolytic Solution
  • 03:55Substrate Cleaning
  • 05:24Al Gate Electrode Evaporation
  • 06:31Anodization of the Al Layer
  • 07:41ZnO Active Layer Deposition
  • 08:38Drain and Source Electrodes Deposition
  • 09:36TFT Electrical Characterization
  • 10:09Resultados
  • 11:22Conclusion

Summary

Traducción Automática

Traducción Automática

Anodization parameters for growth of the aluminum-oxide dielectric layer of zinc-oxide thin-film transistors (TFTs) are varied to determine the effects on the electrical parameter responses. Analysis of variance (ANOVA) is applied to a Plackett-Burman design of experiments (DOE) to determine the manufacturing conditions that result in optimized device performance.

Tags

Aluminum OxideAnodizationThin-film TransistorsDielectric LayerElectrolytic SolutionSubstrate CleaningAluminum Electrode DepositionAnodization ProcessElectrical CharacterizationPlackett-Burman Design Of Experiments

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