7,636 Views
•
05:57 min
April 01, 2020
DOI:
10.3791/60269-v
Read Article
Cite this Article
Tyler, N. A., Guerber, S., Fowler, D., Malhouitre, S., Garcia, S., Grosse, P., Szelag, B. Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station. J. Vis. Exp. (158), e60269, doi:10.3791/60269 (2020).
Download .ris file
Copy
Share Video
.