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利用地图量化 X 射线荧光数据
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Quantifying X-Ray Fluorescence Data Using MAPS
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利用地图量化 X 射线荧光数据

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14:58 min

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February 17, 2018

DOI:

10.3791/56042-v

DOI:
10.3791/56042-v

•

14:58 min
February 17, 2018

•

1 Views
, , , , ,
1School for Engineering of Matter, Transport, and Energy,Arizona State University, 2School of Electrical, Computer, and Energy Engineering,Arizona State University, 3Advanced Photon Source,Argonne National Laboratory

Summary

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在这里, 我们演示使用 X 射线荧光拟合软件, 地图, 由阿贡国家实验室创建的荧光显微数据的量化。结果的量化数据有助于了解样本中的元素分布和化学计量比率。

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Nietzold, T., West, B. M., Stuckelberger, M., Lai, B., Vogt, S., Bertoni, M. I. Quantifying X-Ray Fluorescence Data Using MAPS. J. Vis. Exp. (132), e56042, doi:10.3791/56042 (2018).

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