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08:48 min
November 09, 2015
DOI:
10.3791/52720-v
我们对在HF原位改变处理的Si(001)面成亲水或疏水状态通过照射在微流体室中填充用H 2 O 2 / H 2 O的溶液(0.01%-0.5%)或甲醇溶液样品的处理报告使用相对低的脉冲能量密度的脉冲UV激光。
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Liu, N., Moumanis, K., Dubowski, J. J. Selective Area Modification of Silicon Surface Wettability by Pulsed UV Laser Irradiation in Liquid Environment. J. Vis. Exp. (105), e52720, doi:10.3791/52720 (2015).
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