Journal
/
Neurowissenschaften
/
神经科学中透射电镜切片采样的一种无偏方法
JoVE Journal
Neurowissenschaften
This content is Free Access.
JoVE Journal Neurowissenschaften
An Unbiased Approach of Sampling TEM Sections in Neuroscience
Please note that all translations are automatically generated. Click here for the English version.

神经科学中透射电镜切片采样的一种无偏方法

6,897 Views

•

10:56 min

•

April 13, 2019

DOI:

10.3791/58745-v

DOI:
10.3791/58745-v

•

10:56 min
April 13, 2019

•

10 Views
, , , , , , , , , , , ,
1Department of Cell Biology, Histology and Embryology, Gottfried Schatz Research Center,Medical University of Graz, 2Department of Pharmacology, Otto Loewi Research Center,Medical University of Graz, 3Division of General Neurology, Department of Neurology,Medical University of Graz, 4Institute of Pathology,Medical University of Graz, 5Department of Pathology, Medical Faculty,Otto von Guericke University Magdeburg

Summary

Automatically generated

我们介绍了一种新的脑组织电子显微镜研究工作流程。该方法允许用户以无偏见的方式检查神经元特征。对于元素分析, 我们还提供了一个脚本, 该脚本自动化了随机采样的大部分工作流。

Explore More Videos

– Unbiased Sampling- Electron Microscopy- Neuroscience- Quantification- Numerical Density- Synapses- Neural Network- Sample Preparation- Ultramicrotome- Serial Sections- Slot Grid- Counterstaining- Transmission Electron Microscope (TEM)- TEM Serial Section Software- Region Of Interest (ROI)- Random Point Sampling

Read Article

Cite this Article

Wernitznig, S., Reichmann, F., Sele, M., Birkl, C., Haybäck, J., Kleinegger, F., Birkl-Töglhofer, A., Krassnig, S., Wodlej, C., Holzer, P., Kummer, D., Bock, E., Leitinger, G. An Unbiased Approach of Sampling TEM Sections in Neuroscience. J. Vis. Exp. (146), e58745, doi:10.3791/58745 (2019).

Download .ris file

Copy

Share Video

.

Copy