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在质谱选择离子软着陆准备好定义的表面原位二次离子质谱和红外光谱

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Chemie

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JoVE Journal Chemie

In Situ SIMS and IR Spectroscopy of Well-defined Surfaces Prepared by Soft Landing of Mass-selected Ions

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在质谱选择离子软着陆准备好定义的表面原位二次离子质谱和红外光谱

17,894 Views

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10:22 min

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June 16, 2014

DOI:

10.3791/51344-v

DOI:

10.3791/51344-v

•

10:22 min

June 16, 2014

•

44 Views

Grant E. Johnson¹, K. Don Dasitha Gunaratne¹, Julia Laskin¹

¹Physical Sciences Division,Pacific Northwest National Laboratory

Summary

质量选择离子软着陆表面上是一个功能强大的方法对高度控制的新型材料的准备。再加上通过原位二次离子质谱（SIMS）和红外反射吸收光谱（IRRAS）分析，软着陆提供前所未有的见解的良好定义的物种与表面的相互作用。

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