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Picometer-Precision Atomic Position Tracking through Electron Microscopy
JoVE 杂志
化学
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JoVE 杂志 化学
Picometer-Precision Atomic Position Tracking through Electron Microscopy

Picometer-Precision Atomic Position Tracking through Electron Microscopy

5,640 Views

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15:04 min

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July 03, 2021

DOI:

10.3791/62164-v

DOI:
10.3791/62164-v

•

15:04 min
July 03, 2021

•

12 Views
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1Department of Materials Science & Engineering,The Pennsylvania State University, 2Center for Nanophase Materials Sciences,Oak Ridge National Laboratory

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Cite this Article

Miao, L., Chmielewski, A., Mukherjee, D., Alem, N. Picometer-Precision Atomic Position Tracking through Electron Microscopy. J. Vis. Exp. (173), e62164, doi:10.3791/62164 (2021).

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