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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
JoVE 杂志
化学
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JoVE 杂志 化学
Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

4,949 Views

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07:24 min

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May 10, 2021

DOI:

10.3791/62015-v

DOI:
10.3791/62015-v

•

07:24 min
May 10, 2021

•

11 Views
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1Electron Nanoscopy Division, Advanced Measurement Technology Center, Institute of Materials & Systems for Sustainability,Nagoya University

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Ohtsuka, M., Muto, S. Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis. J. Vis. Exp. (171), e62015, doi:10.3791/62015 (2021).

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