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Targeted Studies Using Serial Block Face and Focused Ion Beam Scan Electron Microscopy
JoVE 杂志
生物学
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JoVE 杂志 生物学
Targeted Studies Using Serial Block Face and Focused Ion Beam Scan Electron Microscopy

Targeted Studies Using Serial Block Face and Focused Ion Beam Scan Electron Microscopy

8,827 Views

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09:09 min

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August 10, 2019

DOI:

10.3791/59480-v

DOI:
10.3791/59480-v

•

09:09 min
August 10, 2019

•

1 Views
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1VIB Bio Imaging Core, 2VIB Inflammation Research Center, 3Department of Molecular Biomedical Research,UGent

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Serial Block Face Scanning Electron Microscopy (SBF-SEM)Focused Ion Beam Scanning Electron Microscopy (FIB-SEM)3D UltrastructureArabidopsis ThalianaRoot TipsSample PreparationFixationPost-fixationOsmium TetroxideRuthenium RedThiocarbohydrazide (TCH)DehydrationMicrowavePhosphate Buffer

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Guérin, C. J., Kremer, A., Borghgraef, P., Lippens, S. Targeted Studies Using Serial Block Face and Focused Ion Beam Scan Electron Microscopy. J. Vis. Exp. (150), e59480, doi:10.3791/59480 (2019).

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