Journal
/
工程学
/
A Method for Obtaining Serial Ultrathin Sections of Microorganisms in Transmission Electron Microscopy
JoVE 杂志
工程学
需要订阅 JoVE 才能查看此.  登录或开始免费试用。
JoVE 杂志 工程学
A Method for Obtaining Serial Ultrathin Sections of Microorganisms in Transmission Electron Microscopy

A Method for Obtaining Serial Ultrathin Sections of Microorganisms in Transmission Electron Microscopy

DOI:
10.3791/56235-v

•

09:46 min

•

January 17, 2018

•

,
1Medical Mycology Research Center,Chiba University

Chapters

  • 00:05Title
  • 00:45Preparation of Support Film
  • 01:53Trimming the Specimen Block
  • 03:31Preparing the Specimen
  • 04:59Making Serial Sections
  • 06:18Picking up Serial Sections
  • 07:23Staining and Observation of Serial Sections
  • 08:14Results: Serial Ultrathin Sections of Microorganisms
  • 09:18Conclusion

Summary

自动翻译

自动翻译

This study presents reliable and easy procedures for obtaining serial ultrathin sections of a microorganism without expensive equipment in transmission electron microscopy.

Tags

Ultrathin SectionsTransmission Electron MicroscopySerial SectioningFormvar FilmSpecimen Block TrimmingDiamond KnifeMicrotomeCell BiologyThree-dimensional Structural Information

Article

Embed

添加到播放列表

Usage Statistics

Related Videos

Revealing Dynamic Processes of Materials in Liquids Using Liquid Cell Transmission Electron Microscopy

In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices

In Depth Analyses of LEDs by a Combination of X-ray Computed Tomography (CT) and Light Microscopy (LM) Correlated with Scanning Electron Microscopy (SEM)

Studying Dynamic Processes of Nano-sized Objects in Liquid using Scanning Transmission Electron Microscopy

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction

Fabrication of Magnetic Nanostructures on Silicon Nitride Membranes for Magnetic Vortex Studies Using Transmission Microscopy Techniques

Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope

Graphene-Assisted Quasi-van der Waals Epitaxy of AlN Film on Nano-Patterned Sapphire Substrate for Ultraviolet Light Emitting Diodes

In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx

Performing In Situ Closed-Cell Gas Reactions in the Transmission Electron Microscope

Read Article