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Precision Milling of Carbon Nanotube Forests Using Low Pressure Scanning Electron Microscopy
JoVE 杂志
工程学
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JoVE 杂志 工程学
Precision Milling of Carbon Nanotube Forests Using Low Pressure Scanning Electron Microscopy
DOI:

08:10 min

February 05, 2017

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Chapters

  • 00:05Title
  • 01:02Carbon Nanotube (CNT) Forest Sample and Environmental Scanning Electron Microscope (ESEM) Preparation
  • 03:52SEM Setup in Low Pressure Water Vapor
  • 05:10CNT Forest Milling
  • 06:47Results: Precision Milling of Carbon Nanotube Forests
  • 07:46Conclusion

Summary

自动翻译

Low pressure scanning electron microscopy in a water vapor ambient is used to machine nanoscale to microscale features in carbon nanotube forests.

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