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Chapters
- 00:05Introduction
- 00:42Instrument and Blotting Parameter Set-up
- 02:53Crystal Harvest Process
- 04:01Light Microscopy for Sample Density Assessment
- 04:30Scanning Electron Microscopy for Sample Assessment
- 05:38Grid Preparation for the Diffraction Experiments at VMXm
- 06:47Results: Analysis of the Microcrystals on the Grids
- 08:24Conclusion
The signal-to-noise ratio of data is one of the most important considerations in performing X-ray diffraction measurements from microcrystals. The VMXm beamline provides a low-noise environment and microbeam for such experiments. Here, we describe sample preparation methods for mounting and cooling microcrystals for VMXm and other microfocus macromolecular crystallography beamlines.
