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Tüm elektronik Nanosecond çözüldü tarama tünelleme mikroskobu: tek Dopant şarj Dynamics incelenmesi kolaylaştırılması
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January 19, 2018
DOI:
1Department of Physics,University of Alberta, 2National Institute for Nanotechnology,National Research Council of Canada, Edmonton, 3Max Planck Institute for the Structure and Dynamics of Matter, 4Max Planck Institute for Solid State Research, 5Department of Physics and Astronomy,University of Manitoba, 6Joint Attosecond Science Laboratory,University of Ottawa
Summary
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Silikon dopant atomlar nano saniye çözüldü şarj dinamikleri ile tarama tünel mikroskop gözlemlemek için tüm elektronik yöntemi göstermektedir.
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Rashidi, M., Vine, W., Burgess, J. A., Taucer, M., Achal, R., Pitters, J. L., Loth, S., Wolkow, R. A. All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics. J. Vis. Exp. (131), e56861, doi:10.3791/56861 (2018).
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