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Todo-eletrônico nanossegundo-resolvido encapsulamento microscopia: Facilitar a investigação do Dopant única carga dinâmica
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11:33 min
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January 19, 2018
DOI:
1Department of Physics,University of Alberta, 2National Institute for Nanotechnology,National Research Council of Canada, Edmonton, 3Max Planck Institute for the Structure and Dynamics of Matter, 4Max Planck Institute for Solid State Research, 5Department of Physics and Astronomy,University of Manitoba, 6Joint Attosecond Science Laboratory,University of Ottawa
Summary
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Vamos demonstrar um método todo-eletrônico para observar a dinâmica de carga nanossegundo-resolvido de átomos do dopant em silicone com um microscópio de tunelamento.
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Rashidi, M., Vine, W., Burgess, J. A., Taucer, M., Achal, R., Pitters, J. L., Loth, S., Wolkow, R. A. All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics. J. Vis. Exp. (131), e56861, doi:10.3791/56861 (2018).
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