/

/

すべて電子ナノ秒分解走査型トンネル顕微鏡: 単一ドーパントの電荷ダイナミクスの調査を促進します。

JoVE Journal
Engineering

A subscription to JoVE is required to view this content. Sign in or start your free trial.

JoVE Journal Engineering

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Please note that all translations are automatically generated. Click here for the English version.

すべて電子ナノ秒分解走査型トンネル顕微鏡: 単一ドーパントの電荷ダイナミクスの調査を促進します。

8,926 Views

•

11:33 min

•

January 19, 2018

DOI:

10.3791/56861-v

DOI:

10.3791/56861-v

•

11:33 min

January 19, 2018

•

2 Views

Mohammad Rashidi^1,2, Wyatt Vine¹, Jacob A.J. Burgess^3,4,5, Marco Taucer^1,2,6, Roshan Achal¹, Jason L. Pitters², Sebastian Loth^3,4, Robert A. Wolkow^1,2

¹Department of Physics,University of Alberta, ²National Institute for Nanotechnology,National Research Council of Canada, Edmonton, ³Max Planck Institute for the Structure and Dynamics of Matter, ⁴Max Planck Institute for Solid State Research, ⁵Department of Physics and Astronomy,University of Manitoba, ⁶Joint Attosecond Science Laboratory,University of Ottawa

Summary

走査型トンネル顕微鏡を用いたシリコン中のドーパント原子のナノ秒分解電荷ダイナミクスを観察するすべての電子方法を示す.

Explore More Videos

Nanosecond-resolved Scanning Tunneling Microscopy Single Dopant Charge Dynamics Time-resolved Scanning Tunneling Microscopy Semiconductor Dopants Tunneling Current Ultra-high Vacuum Cryogenic Temperatures Arbitrary Function Generator Radio Frequency Switches Silicon Wafer Sample Preparation Tungsten Filament

Read Article