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Tutto-elettronico nanosecondo-risolto scansione microscopio a effetto tunnel: Agevolare le indagini di drogante singola carica dinamica
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January 19, 2018
DOI:
1Department of Physics,University of Alberta, 2National Institute for Nanotechnology,National Research Council of Canada, Edmonton, 3Max Planck Institute for the Structure and Dynamics of Matter, 4Max Planck Institute for Solid State Research, 5Department of Physics and Astronomy,University of Manitoba, 6Joint Attosecond Science Laboratory,University of Ottawa
Summary
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Dimostriamo un metodo tutto-elettronico per osservare le dinamiche di nanosecondo-risolto carica degli atomi di drogante nel silicio con un microscopio a effetto tunnel.
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Rashidi, M., Vine, W., Burgess, J. A., Taucer, M., Achal, R., Pitters, J. L., Loth, S., Wolkow, R. A. All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics. J. Vis. Exp. (131), e56861, doi:10.3791/56861 (2018).
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