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Entièrement électronique résolue en nanosecondes Tunneling microscope à balayage : Faciliter l’Investigation de la dynamique de Charge unique de Dopant
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11:33 min
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January 19, 2018
DOI:
1Department of Physics,University of Alberta, 2National Institute for Nanotechnology,National Research Council of Canada, Edmonton, 3Max Planck Institute for the Structure and Dynamics of Matter, 4Max Planck Institute for Solid State Research, 5Department of Physics and Astronomy,University of Manitoba, 6Joint Attosecond Science Laboratory,University of Ottawa
Summary
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Nous démontrons une méthode entièrement électronique afin d’observer la dynamique de l’accusation résolue en nanosecondes d’atomes de dopant dans le silicium avec un microscope à effet tunnel.
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Rashidi, M., Vine, W., Burgess, J. A., Taucer, M., Achal, R., Pitters, J. L., Loth, S., Wolkow, R. A. All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics. J. Vis. Exp. (131), e56861, doi:10.3791/56861 (2018).
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