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Bir İzleme Ortamında plasmonik Yakalama ve Nanopartiküller Yayın
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Engineering
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JoVE Journal Engineering
Plasmonic Trapping and Release of Nanoparticles in a Monitoring Environment
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Bir İzleme Ortamında plasmonik Yakalama ve Nanopartiküller Yayın

Türkçe

Automatically Generated

7,448 Views

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09:13 min

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April 04, 2017

DOI:

10.3791/55258-v

DOI:
10.3791/55258-v

•

09:13 min
April 04, 2017

•

1 Views
,
1Division of Scientific Instrumentation,Korea Basic Science Institute (KBSI), 2School of Mechanical Engineering,Gwangju Institute of Science and Technology (GIST)

Summary

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plasmonik cımbız katılan bir mikroçip üretim süreci burada sunulmuştur. Mikroçip maksimum sıkıştırma kuvvetinin ölçülmesi için bir tuzak parçacığın görüntülenmesine olanak sağlar.

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Cite this Article

Kim, J., Lee, Y. Plasmonic Trapping and Release of Nanoparticles in a Monitoring Environment. J. Vis. Exp. (122), e55258, doi:10.3791/55258 (2017).

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