Measurement of Quantum Interference in a Silicon Ring Resonator Photon Source

Jeffrey A. Steidle; Michael L. Fanto; Stefan F. Preble; Christopher C. Tison; Gregory A. Howland; Zihao Wang; Paul M. Alsing

doi:10.3791/55257

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Engineering

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Meting van Quantum Interference in een Silicon Ring Resonator Photon Source

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Measurement of Quantum Interference in a Silicon Ring Resonator Photon Source

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Meting van Quantum Interference in een Silicon Ring Resonator Photon Source

8,207 Views

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12:19 min

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April 04, 2017

DOI:

10.3791/55257-v

DOI:

10.3791/55257-v

•

12:19 min

April 04, 2017

•

3 Views

Jeffrey A. Steidle¹, Michael L. Fanto^1,2, Stefan F. Preble¹, Christopher C. Tison^2,3,4, Gregory A. Howland², Zihao Wang¹, Paul M. Alsing²

¹Microsystems Engineering,Rochester Institute of Technology, ²Air Force Research Laboratory, Rome, NY, ³Department of Physics,Florida Atlantic University, ⁴Quanterion Solutions Incorporated

Summary

Silicon fotonische chips hebben het potentieel om complexe geïntegreerde quantum systemen te realiseren. Hier voorgesteld is een werkwijze voor het bereiden en testen van een silicium chip voor fotonische quantum metingen.

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Meting van Quantum Interference in een Silicon Ring Resonator Photon Source

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