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Preparación de muestras mediante fresado por haz de iones focalizado correlativo en 3D para tomografía crioelectrónica de alta resolución
JoVE Journal
Biologia
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JoVE Journal Biologia
Sample Preparation by 3D-Correlative Focused Ion Beam Milling for High-Resolution Cryo-Electron Tomography
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Preparación de muestras mediante fresado por haz de iones focalizado correlativo en 3D para tomografía crioelectrónica de alta resolución

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08:20 min

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October 25, 2021

DOI:

10.3791/62886-v

DOI:
10.3791/62886-v

•

08:20 min
October 25, 2021

•

5 Views
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1Max Planck Institute of Biochemistry, 2Max Planck Institute for Biophysics, 3Fondazione Human Technopole

Tags

3D-correlative FIB MillingCryo-electron TomographyCryo-fluorescence MicroscopyCryo-FIB-SEMSEM Grid OverviewFLM-SEM CorrelationIon Beam ImagingCellular Ultrastructure

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Cite this Article

Bieber, A., Capitanio, C., Wilfling, F., Plitzko, J., Erdmann, P. S. Sample Preparation by 3D-Correlative Focused Ion Beam Milling for High-Resolution Cryo-Electron Tomography. J. Vis. Exp. (176), e62886, doi:10.3791/62886 (2021).

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