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08:20 min
October 25, 2021
DOI:
10.3791/62886-v
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Bieber, A., Capitanio, C., Wilfling, F., Plitzko, J., Erdmann, P. S. Sample Preparation by 3D-Correlative Focused Ion Beam Milling for High-Resolution Cryo-Electron Tomography. J. Vis. Exp. (176), e62886, doi:10.3791/62886 (2021).
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