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F⁻ 의 310 Nm 분리에 의해 설명 하는 음이온의 광전자 이미징

JoVE Journal
Química

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JoVE Journal Química

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F⁻

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F⁻ 의 310 Nm 분리에 의해 설명 하는 음이온의 광전자 이미징

8,461 Views

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06:53 min

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July 27, 2018

DOI:

10.3791/57989-v

DOI:

10.3791/57989-v

•

06:53 min

July 27, 2018

•

4 Views

Justin Lyle, Sudharson Ravishankar Chandramoulee, C. Annie Hart, Richard Mabbs

¹Department of Chemistry,Washington University in St. Louis

Tags

Photoelectron Imaging Anions Electron Scattering Molecular Spectroscopy Reaction Dynamics Molecular Orbitals Electronic Structure Vibrational Energy Levels Scattering Resonances Auto-detachment Resonances Pulsed Nozzle Gas Mixture Discharge Time-of-flight Mass Spectrometry Imaging Mode Laser Trigger Repeller And Extractor Electrodes

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