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量子干涉效应在硅谐振环光子源测量
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工学
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JoVE Journal 工学
Measurement of Quantum Interference in a Silicon Ring Resonator Photon Source
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量子干涉效应在硅谐振环光子源测量

8,202 Views

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12:19 min

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April 04, 2017

DOI:

10.3791/55257-v

DOI:
10.3791/55257-v

•

12:19 min
April 04, 2017

•

3 Views
, , , , , ,
1Microsystems Engineering,Rochester Institute of Technology, 2Air Force Research Laboratory, Rome, NY, 3物理学科,Florida Atlantic University, 4Quanterion Solutions Incorporated

概要

Automatically generated

硅光子芯片必须认识到复杂的集成量子系统的潜力。这里介绍的是用于制备和测试对于量子测量硅光子芯片的方法。

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Cite this Article

Steidle, J. A., Fanto, M. L., Preble, S. F., Tison, C. C., Howland, G. A., Wang, Z., Alsing, P. M. Measurement of Quantum Interference in a Silicon Ring Resonator Photon Source. J. Vis. Exp. (122), e55257, doi:10.3791/55257 (2017).

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