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表面附近的高速粒子图像测速
JoVE Journal
Ingegneria
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JoVE Journal Ingegneria
High-speed Particle Image Velocimetry Near Surfaces
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表面附近的高速粒子图像测速

32,539 Views

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11:59 min

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June 24, 2013

DOI:

10.3791/50559-v

DOI:
10.3791/50559-v

•

11:59 min
June 24, 2013

•

5 Views
,
1Department of Mechanical Engineering,University of Michigan

Summary

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研究瞬变流边界附近，使用高分辨率，高速粒子图像测速（PIV）的一个过程。 PIV是一种非侵入式测量技术适用于任何光学访问的流量通过优化多个参数的限制，例如图像和记录性能，激光表属性，和分析算法。

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Cite this Article

Lu, L., Sick, V. High-speed Particle Image Velocimetry Near Surfaces. J. Vis. Exp. (76), e50559, doi:10.3791/50559 (2013).

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