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1Institute of Energy and Climate Research – Fundamental Electrochemistry (IEK-9),Forschungszentrum Jülich GmbH, 2Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons,Forschungszentrum Jülich GmbH, 3Dyson School of Design Engineering,Imperial College London, 4Central Facility for Electron Microscopy (GFE),RWTH Aachen University, 5Institute of Physical Chemistry,RWTH Aachen University
Chapitres
- 00:04Introduction
- 01:00Preparation of Half‐Cut TEM Grids with Coated Si Nanoparticles for Checking the Suitability of ALD‐Deposited Titanium Dioxide Coatings
- 01:53Preparing the Tungsten Needle
- 02:37Loading the Drop‐Casted TEM Grid and Lithium Loaded Tungsten Needle into the In Situ TEM Holder
- 03:15Inserting the Assembled In Situ Holder into the TEM
- 04:02Performing the In Situ Biasing Experiment in the TEM and Analyzing the TEM Images
- 05:37Results: Screening Method of Potential Coatings for All‐Solid‐State Batteries Using In Situ Transmission Electron Microscopy
- 06:28Conclusion
En utilisant le changement de volume des nanoparticules de Si pendant la (dé)lithiation, le présent protocole décrit une méthode de criblage des revêtements potentiels pour les batteries entièrement à semi-conducteurs utilisant la microscopie électronique à transmission in situ .
