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一种新的方法<em>原位</em>纳米级样品的机电表征

Journal JoVE
Ingénierie

This content is Free Access.

Journal JoVE Ingénierie

A Novel Method for In Situ Electromechanical Characterization of Nanoscale Specimens

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一种新的方法<em>原位</em>纳米级样品的机电表征

8,768 Views

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07:15 min

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June 02, 2017

DOI:

10.3791/55735-v

DOI:

10.3791/55735-v

•

07:15 min

June 02, 2017

•

3 Views

Russell C. Reid^1,2, Alberto Piqué¹, Wonmo Kang^1,3

¹Materials Science and Technology Division,US Naval Research Laboratory, ²American Society for Engineering Education—Naval Research Laboratory (ASEE-NRL), ³Leidos Corporation

Summary

使用宏观样品，隔离电气和热效应对电辅助变形（EAD）是非常困难的。已经开发了金属样品微观和纳米结构以及定制测试程序，以评估施加的电流对形成的影响，而不会有焦耳加热和这些样品上位错的演变。

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